Widened Range of Applications for Automated Sample Preparation Equipment for X-ray analysis

Historically automated equipment for X-ray sample preparation was limited to routine samples with a limited variation range of the composition based on the risk of cross contamination.

Based on the latest improvement of the Centaurus automatic mill and press this statement must be revised. The introduction of alternative enhanced cleaning of the equipment in combination with the use of advanced coated surfaces, improved design of specific parts and adapted processing procedure make this automated equipment fit for more challenging applications.

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We ameliorated the cross contamination behavior of the Centaurus by 3 times that made it even necessary to switch to a different set of reference material to be able to observe any cross contamination effects.

The example below demonstrates this effect for the combination of alternating 3 lime stone and 3 sinter samples, where the elemental concentration of iron is used as an indicator for the carry over between the different sample types. The lime stone chose for the ultimate test represents a factor of 1400 in the concentration of iron in the materials.

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Do you want to collect high-quality X-ray reflectometry data? Good practices that will help

Thursday 15 December 2016

Don’t miss this in depth webinar sharing with you all the useful practices and tips helping you to collect high-quality XRR data from your layered samples.

X-ray reflectometry (XRR) is a well-established analytical method for the characterization of thin layered structures, surfaces and interfaces. It is used to determine layer thicknesses and densities and provides roughness-related information. The basics of XRR and the analysis of XRR data were discussed in one of our previous webinars available on demand. This time, the focus will be on a typical workflow, from setting up the X-ray optics of a diffractometer, the essential steps of the sample alignment procedures to the final XRR measurement.

Sign up today for this exciting free webinar!

Webinar details:

Time: 10.00 am New York or 4.00 pm CET, the Netherlands

Duration: 1 hour

Panelist:  Zhaohui Bao – X-ray diffraction specialist at PANalytical B.V.

 CLICK HERE