PANalytical launches Epsilon 1 for small spot analysis

Focus on the details to capture the bigger picture.

PANalytical, world’s leading supplier of analytical X-ray instrumentation, software and expertise, announces the introduction of a new Epsilon 1 X-ray fluorescence (XRF) spectrometer. This new member of the Epsilon 1 family has been designed for small spot analysis, and is the most powerful benchtop spectrometer in its class. It provides a compact and cost-effective ‘out-of-the-box’ solution, ready for the analysis of small objects or small inclusions in rocks, electronic appliances, toys, jewelry or finished products.

The instrument can handle a large variety of sample types, from small objects to larger final products. They can all be placed directly in the spectrometer without the need of any sample preparation. The integrated color camera allows straightforward positioning of the sample directly in front of the small measurement spot. The small footprint and self-contained design make the Epsilon 1 an ideal solution for elemental analysis and can be placed close to the sample location, like production facilities, exploration sites, at a shop’s counter or even taken to crime scenes for forensic investigation.

The performance of the spectrometer meets the standard test methods required by different directives and regulations in various industry markets, like RoHS-2, WEEE and ELV for electronics and CPSIA for consumer goods. The Epsilon 1 is specifically designed to analyze a wide range of samples in accordance to these regulations, and meets the performance required by international test methods like ASTM F2617 for RoHS-2.

“The combination of hardware and software in the Epsilon 1 for small spot analysis provides you with flexible and robust spot-on elemental analysis”, according to Dr. Lieven Kempenaers, benchtop product manager at Malvern PANalytical.

 

Know More

Solving structures from powder diffraction data

Properties of materials are directly related to their crystal structure. Traditionally crystal structures are solved using single crystal X-ray diffraction. However, many materials are only available as powders. The first structure solved from powder diffraction data was LiSbWO6 [Le Bail et al., 1988]. Since then, structure solution from powder data has developed into an established technique suitable for any crystalline material. The two key components for a successful structure solution from powder data are excellent data quality and proven optimized algorithms for data analysis. PANalytical’s instrument portfolio supports a variety of measurement geometries from standard Bragg-Brentano (suitable for most inorganic materials), to the more advanced capillary geometry for compounds with low absorption. For each geometry the optical path is optimized to deliver the best data quality. The HighScore suite offers a number of tools and algorithms guiding users through all the steps required for structure solution.

Learn more about structure solution from powder data. The articles report structures solved using PANalytical equipment Empyrean and Aeris

Click here to read about the investigation of the crystal structures of some of silver vanadates using the Aeris Research edition and to download the related data sheet.