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Ask an Expert: Transmission vs reflection XRD measurements
May 6 @ 9:00 AM - 10:00 AM
Practical tips on type of experiments to run, data quality to expect and more
In almost every powder diffractometer, the reflection geometry is used. This is where the detector is on the same side of the sample surface. This geometry works very well for inorganic materials that can be prepared as flat samples with randomly oriented crystallites. However, it is very difficult to measure reflections below 5 degrees 2Theta accurately using reflection geometry. For instance, special care is needed to keep the background to a reasonable level. And the peak position is very sensitive to any error in sample preparation.
Transmission geometry on the other hand is easy and straight forward for measuring reflections at low angles. Moreover, transmission measurements let you minimize preferred orientation effects. They are an especially great match for low-absorbing organic materials such as those used in the pharmaceutical industry.
During this webinar, our senior application scientist, Dr Daniel Lee will introduce the basics of transmission and reflection measurements. He will share which types of samples and experiments would be more viable for transmission measurement. Look out for his tips when conducting such research too. He will showcase the benefits and data quality of transmission measurements on various samples. For instance the intense peaks and clear visibility of reflections. Dr Lee will demonstrate data collected from Malvern Panalytical’s Empyrean floorstanding as well as the Aeris compact XRD. For the Aeris XRD, this is part of the suite of new and powerful features recently added to its capabilities.
Interested to learn more? Scroll down to register your interest in our series of XRD webinars.
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- Measurement type:
- Phase quantification
- May 06 2021 – May 06 2021
- 9:00 Am – 10:00 AM (Arabian Standard TIme)
- Event type:
- Webinar – Live
- Aeris range
- X-ray Diffraction (XRD)
What will I learn?
- The basics of transmission version reflection measurements
- Which experiments and types of samples are more viable for transmission measurements
- Tips to note when conducting transmission measurement research
- See the level of high quality data you can obtain with transmission measurements on both the compact Aeris and floor standing Empyrean XRD
Dr Daniel Lee, Malvern Panalytical’s senior application specialist for XRD, based in South Korea
Who should attend?
- Researchers involved in materials characterization analysis who want to expand their knowledge in X-ray diffraction
- Relevant industries include (but are not limited to) those researching on battery, powder metallurgy, cement, mining and minerals, environmental monitoring, pharmaceuticals and more
- R and D and manufacturing leaders responsible for appropriate analytics selection
- Scientists engaged in method development for new materials or in supporting root cause analysis investigations in support of product manufacturing
How long is this webinar?
- 40 minutes is the intended speaker time with additional time for addressing queries.